One-port de-embedding technique for the quasi-optical characterization of integrated components

Lists

Download

Full text not archived in this repository.

Tools

Hadjiloucas, S. ORCID: https://orcid.org/0000-0003-2380-6114, Walker, G. C. and Bowen, J. W. (2013) One-port de-embedding technique for the quasi-optical characterization of integrated components. IEEE Sensors Journal, 13 (1). pp. 111-123. ISSN 1530-437X doi: 10.1109/JSEN.2012.2226713

Abstract/Summary

We describe a one-port de-embedding technique suitable for the quasi-optical characterization of terahertz integrated components at frequencies beyond the operational range of most vector network analyzers. This technique is also suitable when the manufacturing of precision terminations to sufficiently fine tolerances for the application of a TRL de-embedding technique is not possible. The technique is based on vector reflection measurements of a series of easily realizable test pieces. A theoretical analysis is presented for the precision of the technique when implemented using a quasi-optical null-balanced bridge reflectometer. The analysis takes into account quantization effects in the linear and angular encoders associated with the balancing procedure, as well as source power and detector noise equivalent power. The precision in measuring waveguide characteristic impedance and attenuation using this de-embedding technique is further analyzed after taking into account changes in the power coupled due to axial, rotational, and lateral alignment errors between the device under test and the instruments' test port. The analysis is based on the propagation of errors after assuming imperfect coupling of two fundamental Gaussian beams. The required precision in repositioning the samples at the instruments' test-port is discussed. Quasi-optical measurements using the de-embedding process for a WR-8 adjustable precision short at 125 GHz are presented. The de-embedding methodology may be extended to allow the determination of S-parameters of arbitrary two-port junctions. The measurement technique proposed should prove most useful above 325 GHz where there is a lack of measurement standards.

Altmetric Badge

Item Type	Article
URI	https://reading-clone.eprints-hosting.org/id/eprint/31539
Item Type	Article
Refereed	Yes
Divisions	Life Sciences > School of Biological Sciences > Department of Bio-Engineering
Uncontrolled Keywords	De-embedding, integrated component characterization, null-balance quasi-optical reflectometer, S-parameters.
Publisher	IEEE
Download/View statistics	View download statistics for this item

Deposit Details

Date Deposited:	18 Mar 2013 14:06	Date item deposited into CentAUR
Last Modified:	09 Jun 2024 01:41	Date item last modified

References

[1] G. F. Engen, “Calibration technique for automated network analyzers with application to adapter evaluation,” IEEE Trans. Microw. Theory Tech., vol. 22, no. 12, pp. 1255–1260, Dec. 1974. [2] R. W. Beatty, G. F. Engen, and W. J. Anson, “Measurement of reflections and losses of waveguide joints and connectors using microwave reflectometer techniques,” IRE Trans. Instrum., vol. 9, no. 2, pp. 219–226, Sep. 1960. [3] G. F. Engen, “An extension to the sliding short method of connector and adaptor evaluation,” J. Res. Nat. Bureau Stand., vol. 75C, nos. 3–4, pp. 177–183, 1971. [4] G. F. Engen and C. E. Hoer, “Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer,” IEEE Trans. Microw. Theory Tech., vol. 27, no. 12, pp. 987–993, Dec. 1979. [5] C. E. Hoer, “Performance of a dual six-port automatic network analyzer,” IEEE Trans. Microw. Theory Tech., vol. 27, no. 12, pp. 993–998, Dec. 1979. [6] F. L.Warner, “Microwave vector network analyzers,” in Microwave Measurements, A. E. Bailey, Ed., 2nd ed. London, U.K.: Peter Peregrinus, 1989. [7] E. J. Griffin, “An introduction to reflectometers and network analyzers,” in Microwave Measurements, A. E. Bailey, Ed., 2nd ed. London, U.K.: Peter Peregrinus, 1989. [8] A. L. Cullen and F. L. Warner, “Circuit analysis,” in Microwave Measurements, A. E. Bailey, Ed., 2nd ed. London, U.K.: Peter Peregrinus, 1989. [9] J. W. Bowen, S. Hadjiloucas, and L. S. Karatzas, “Characteristic impedance measurements of a WR-10 waveguide sample with a dispersive Fourier transform spectrometer,” in Applied Optics and Optoelectronics, A. T. Augousti, Ed. Bristol, U.K.: IOP Publications, 1998, pp. 181–186. [10] S. Hadjiloucas, R. K. H. Galvão, J. W. Bowen, R. Martini, M. Brucherseifer, H. P. M. Pellemans, P. H. Bolivar, H. Kurz, J. Digby, G. M. Parkhurst, and J. M. Chamberlain, “Measurement of propagation constant in waveguides with wideband coherent terahertz spectroscopy,” J. Opt. Soc. Amer. B, vol. 20, no. 2, pp. 391–401, 2003. [11] S. Hadjiloucas, R. K. H. Galvão, V. M. Becerra, J. W. Bowen, R. Martini, M. Brucherseifer, H. P. M. Pellemans, P. H. Bolívar, H. Kurz, and J. M. Chamberlain, “Comparison of subspace and ARX models of a waveguide’s terahertz transient response after optimal wavelet filtering,” IEEE Trans. Microw. Theory Tech., vol. 52, no. 10, pp. 2409–2419, Oct. 2004. [12] S. Hadjiloucas and J. W. Bowen, “Precision of quasi-optical nullbalanced bridge techniques for transmission and reflection coefficient measurements,” Rev. Sci. Instrum., vol. 70, no. 1, pp. 213–219, 1999. [13] J. W. Bowen, S. Hadjiloucas, B. M. Towlson, L. S. Karatzas, S. T. G. Wootton, N. J. Cronin, S. R. Davies, C. E. Collins, J. M. Chamberlain, R. E. Miles, and R. D. Pollard, “Micro-machined waveguide antennas for 1.6 THz,” Electron. Lett., vol. 42, no. 15, pp. 842–843, 2006. [14] J. W. Digby, C. E. McIntosh, G. M. Parkhurst, B. M. Towlson, S. Hadjiloucas, J.W. Bowen, J. M. Chamberlain, R. D. Pollard, R. E. Miles, D. P. Steenson, L. S. Karatzas, N. J. Cronin, and S. R. Davies, “Fabrication and characterization of micromachined rectangular waveguide components for use at millimeter-wave and terahertz frequencies,” IEEE Trans. Microw. Theory Tech., vol. 48, no. 8, pp. 1293–1303, Aug. 2000. [15] J. Baker-Jarvis, E. J. Vanzura, and W. A. Kissick, “Improved technique for determining complex permittivity with the transmission/reflection method,” IEEE Trans. Microw. Theory Tech., vol. 38, no. 8, pp. 1096– 1103, Aug. 1990. [16] N. M. Ridler, “Choosing line lengths for calibrating waveguide vector network analysers at millimetre and sub-millimetre wavelengths,” National Physical Laboratory, Teddington, U.K., NPL Rep. 5, Mar. 2009. [17] W. B. Joyce and B. C. DeLoach, “Alignment of Gaussian beams,” Appl. Opt., vol. 23, no. 23, pp. 4187–4197, 1984. [18] D. H. Martin, Millimetre-Wave Optics. London, U.K.: Univ. London Press, 1993. [19] H. Kogelnik, Coupling and Conversion Coefficients for Optical Modes in Quasi-Optics. New York: Polytechnic Press, 1964, pp. 333–347. [20] S. Hadjiloucas, J. W. Bowen, J. W. Digby, J. M. Chamberlain, and D. P. Steenson, “Quasi-optical characterization of waveguides at frequencies above 100 GHz,” Proc. SPIE, Conf. Terahertz Spectrosc. Appl., vol. 3828, pp. 357–365, Sep. 1999. [21] D. B. Adamson, J. R. Birch, T. E. Hodgetts, B. T. Lunt, D. G. Moss, and A. M. Wallace, “Comparison between free space and in-waveguide power measurement standards at 94 GHz,” Electron. Lett., vol. 27, no. 13, pp. 1134–1136, Jun. 1991. [22] J. G. M. Yip, R. J. Collier, N. M. Ridler, and M.-H. J. Lee, “Traceable high-precision impedance measurements for the millimeter-wave band using dielectric waveguide transmission lines,” IEE Proc.-Sci. Meas. Technol., vol. 153, no. 6, pp. 235–239, Nov. 2006. [23] P. A. S. Cruickshank, D. R. Bolton, D. A. Robertson, R. J. Wylde, and G. M. Smith, “Reducing standing waves in quasi-optical systems by optimal feedhorn design,” in Dig. IRMMW-THz Conf., vol. 2. Cardiff, U.K., 2007, pp. 941–942. [24] M. Hiebel, Fundamentals of Vector Network Analysis, 4th ed. Munich, Germany: Rohde & Schwarz Publication, 2008. [25] D. Rytting, “An analysis of vector measurement accuracy enhancement techniques,” in Proc. Hewlett-Packard RF Microw. Symp. Rec., Mar. 1982, pp. 1–23. [26] S. Rehnmark, “On the calibration process of automatic network analyzer systems,” IEEE Trans. Microw. Theory Tech., vol. 22, no. 4, pp. 457–458, Apr. 1974. [27] R. A. Speciale, “A generalization of the TSD network-analyzer calibration procedure, covering n-port scattering-parameter measurements, affected by leakage errors,” IEEE Trans. Microw. Theory Tech., vol. 25, no. 12, pp. 1100–1115, Dec. 1977. [28] L. C. Oldfield, J. P. Ide, and E. J. Griffin, “A multistate reflectometer,” IEEE Trans. Instrum. Meas., vol. 34, no. 2, pp. 198–201, Jun. 1985. [29] A. G. Gorriti and E. C. Slob, “Synthesis of all known analytical permittivity reconstruction techniques of nonmagnetic materials from reflection and transmission measurements,” IEEE Trans. Geosci. Remote Sens. Lett., vol. 2, no. 4, pp. 433–436, Oct. 2005. [30] M. J. Harvilla and D. P. Nyquist, “Electromagnetic characterization of layered materials via direct and de-embed methods,” IEEE Trans. Instrum. Meas., vol. 55, no. 1, pp. 158–163, Feb. 2006. [31] A. Nicolson and G. Ross, “Measurement of the intrinsic properties of materials by time-domain techniques,” IEEE Trans. Instrum. Meas., vol. 19, no. 4, pp. 377–382, Nov. 1970. [32] W. Weir, “Automatic measurement of complex dielectric constant and permeability at microwave frequencies,” Proc. IEEE, vol. 62, no. 1, pp. 33–36, Jan. 1974. [33] S. S. Stuchly and M. Matuszewski, “A combined total reflectiontransmission method in application to dielectric spectroscopy,” IEEE Trans. Instrum. Meas., vol. 27, no. 3, pp. 285–288, Sep. 1978. [34] D. Pailath and S. Chang, “Improved accuracy for dielectric data,” J. Phys. E, Sci. Instrum., vol. 16, no. 3, pp. 227–230, 1983. [35] J. L. Hesler, A. R. Kerr, W. Grammer, and E. Wollack, “Recommendations for waveguide interfaces to 1 THz,” in Proc. 18th Int. Symp. Space Terahertz Technol., Pasadena, CA, Mar. 2007, pp. 100–103. [36] J. S. Ward, “Terahertz waveguide standards,” in Proc. IEEE MTT-S Int. Microw. Symp. Workshop, San Francisco, CA, no. WFD 06-2, 2006. [37] J. V. Butler, D. K. Rytting, M. F. Iskander, R. D. Pollard, and M. V. Bossche, “16-term error model and calibration procedure for on-wafer network analysis measurements,” IEEE Trans. Microw. Theory Tech., vol. 39, no. 12, pp. 2211–2217, Dec. 1991. [38] I. K. Kim, N. Kidera, S. Pinel, J. Papapolymerou, J. Laskar, J.-G. Yook, and M. M. Tentzeris, “Linear tapered cavity-backed slot antenna for millimeter-wave LTCC modules,” IEEE Antennas Wireless Propag. Lett., vol. 5, no. 12, pp. 175–178, Dec. 2006. [39] B. Pan, Y. Li, G. E. Ponchak, J. Papapolymerou, and M. M. Tentzeris, “A 60-GHz CPW-fed high-gain and broadband integrated horn antenna,” IEEE Trans Antennas Propag., vol. 57, no. 4, pp. 1050–1056, Apr. 2009. [40] P. N. Richardson and H. Y. Lee, “Design and analysis of slotted waveguide arrays,” Microw. J., vol. 31, pp. 109–125, Jun. 1988. [41] W. R. McGrath, C. Walker, M. Yap, and Y. Tai, “Silicon micromachined waveguides for millimeter-wave and submillimeter-wave frequencies,” IEEE Microw. Guided Wave Lett., vol. 3, no. 3, pp. 61–63, Mar. 1993. [42] J. Hirokawa and M. Ando, “Sidelobe suppression in 76-GHz post-wall waveguide-fed parallel-plate slot arrays,” IEEE Trans. Antennas Propag., vol. 48, no. 11, pp. 1727–1732, Nov. 2000. [43] D. Deslandes and K. Wu, “Integrated microstrip and rectangular waveguide in planar form,” IEEE Microw. Wireless Compon. Lett., vol. 11, no. 2, pp. 68–70, Feb. 2001. [44] P. Apel, “Track etching technique in membrane technology,” Rad. Meas., vol. 34, nos. 1–6, pp. 559–566, Jun. 2001. [45] E. C. Niehenke, R. A. Pucel, and I. J. Bahl, “Microwave and millimeterwave integrated circuits,” IEEE Trans. Microw. Theory Tech., vol. 50, no. 3, pp. 846–857, Mar. 2002. [46] L. Yan, W. Hong, G. Hua, J. Chen, K. Wu, and T. J. Cui, “Simulation and experiment on SIW slot array antennas,” IEEE Microw. Wireless Compon. Lett., vol. 14, no. 9, pp. 446–448, Sep. 2004. [47] D. Stephens, P. R. Young, and I. D. Robertson, “W-band substrate integrated waveguide slot antenna,” Electron. Lett., vol. 41, no. 4, pp. 165–167, Feb. 2005. [48] S. Cheng, H. Yousef, and H. Kratz, “79 GHz slot antennas based on substrate integrated waveguides (SIW) in a flexible printed circuit board,” IEEE Trans Antennas Propag., vol. 57, no. 1, pp. 64–71, Jan. 2009. [49] M. Henry, C. E. Free, B. S. Izqueirdo, J. Batchelor, and P. Young, “Millimeter wave substrate integrated waveguide antennas: Design and fabrication analysis,” IEEE Trans. Adv. Packag., vol. 32, no. 1, pp. 93–100, Feb. 2009. [50] G. Gallot, S. P. Jamison, R. W. McGowan, and D. Grischkowsky, “Terahertz waveguides,” J. Opt. Soc. Amer. B, vol. 17, no. 5, pp. 851–863, May 2000. [51] P. L. Kirby, D. Pukala, H. Manohara, I. Mehdi, and J. Papapolymerou, “Characterization of micromachined silicon rectangular waveguide at 400 GHz,” IEEE Microw. Guided Wave Lett., vol. 16, no. 6, pp. 366–368, Jun. 2006. [52] I. Hosako, N. Sekine, M. Patrashin, S. Saito, K. Fukunaga, Y. Kasai, P. Baron, T. Seta, J. Mendrok, S. Ochiai, and H. Yasuda, “At the dawn of a new era in terahertz technology,” Proc. IEEE, vol. 95, no. 8, pp. 1611–1623, Aug. 2007. [53] E. D. Marsh, J. R. Reid, and V. S. Vasilyev, “Gold-plated micromachined millimeter-wave resonators based on rectangular coaxial transmission lines,” IEEE Trans. Microw. Theory Tech., vol. 55, no. 1, pp. 78–84, Jan. 2007. [54] Y. Zhou and S. Lucyszyn, “HFSS modelling anomalies with THz metalpipe rectangular waveguide structures at room temperature,” PIERS Online, vol. 5, no. 3, pp. 201–211, 2009. [55] Y. Liu, L.-M. Si, S.-H. Zhu, and H. Xin, “Experimental realisation of integrated THz electromagnetic crystals (EMXT) H-plane horn antenna,” Electron. Lett., vol. 47, no. 2, pp. 80–82, Jan. 2011. [56] C. D. Nordquist, M. C. Wanke, A. M. Rowen, C. L. Arrington, A. D. Grine, and C. T. Fuller, “Properties of surface metal micromachined rectangular waveguide operating near 3 THz,” IEEE J. Sel. Topics Quantum Electron., vol. 17, no. 1, pp. 130–137, Jan.–Feb. 2011.

University Staff: Request a correction | Centaur Editors: Update this record

Search Google Scholar