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Development and validation of an internationally reliable short-form of the Positive and Negative Affect schedule

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Thompson, E. R. and Phua, F. T. T. orcid id iconORCID: https://orcid.org/0000-0001-5736-5973 (2005) Development and validation of an internationally reliable short-form of the Positive and Negative Affect schedule. In: Academy of International Business Conference, 23-25, November, Manila, Philippines.

Item Type Conference or Workshop Item (Paper)
URI https://reading-clone.eprints-hosting.org/id/eprint/17638
Refereed Yes
Divisions Henley Business School
Science > School of the Built Environment > Organisation, People and Technology group
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Full text not archived in this repository.
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It is advisable to refer to the publisher's version if you intend to cite from this work. See Guidance on citing.

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