Sample-induced beam distortions in terahertz time domain spectroscopy and imaging systems

Bowen, J. W., Walker, G. C. and Hadjiloucas, S. ORCID: https://orcid.org/0000-0003-2380-6114 (2007) Sample-induced beam distortions in terahertz time domain spectroscopy and imaging systems. In: 2007 Joint 32nd International Conference on Infrared and Millimeter Waves and 15th International Conference on Terahertz Electronics, Vols 1 and 2. IEEE, New York, pp. 208-209. ISBN 9781424414383

Abstract/Summary

It is demonstrated that distortion of the terahertz beam profile and generation of a cross-polarised component occur when the beam in terahertz time domain spectroscopy and imaging systems interacts with the sample under test. These distortions modify the detected signal, leading to spectral and image artefacts. The degree of distortion depends on the optical design of the system as well as the properties of the sample.