Phase separated structures in tethered dPS–PMMA copolymer films revealed using X-ray scattering with a novel contrast enhancement agent

[thumbnail of Ru_dPS-PMMA-OH_Paper_100823_D3_with_Figures.pdf]
Preview
Text - Accepted Version
· Please see our End User Agreement before downloading.
| Preview

Please see our End User Agreement.

It is advisable to refer to the publisher's version if you intend to cite from this work. See Guidance on citing.

Add to AnyAdd to TwitterAdd to FacebookAdd to LinkedinAdd to PinterestAdd to Email

O'Driscoll, B. M. D., Newby, G. E. and Hamley, I. W. orcid id iconORCID: https://orcid.org/0000-0002-4549-0926 (2011) Phase separated structures in tethered dPS–PMMA copolymer films revealed using X-ray scattering with a novel contrast enhancement agent. Polymer Chemistry, 2 (3). pp. 619-624. ISSN 1759-9954 doi: 10.1039/C0PY00289E

Abstract/Summary

Tethered deuterated polystyrene-block-polymethyl methacrylate films have been examined by X-ray scattering both in their native state and following treatment with ruthenium tetroxide. The use of the stain, while increasing the thickness of the films, does not significantly alter the lateral structure or periodicity of the films and provides contrast between the two blocks. Both the periodicity of the films and the structure normal to the surface have been identified following staining. Experiments were also performed on films treated by a solvent exchange process, and the effects of staining on these films are discussed.

Altmetric Badge

Item Type Article
URI https://reading-clone.eprints-hosting.org/id/eprint/19210
Identification Number/DOI 10.1039/C0PY00289E
Refereed Yes
Divisions Life Sciences > School of Chemistry, Food and Pharmacy > Department of Chemistry
Publisher Royal Society of Chemistry
Download/View statistics View download statistics for this item

Downloads

Downloads per month over past year

University Staff: Request a correction | Centaur Editors: Update this record

Search Google Scholar