Ambient-pressure endstation of the Versatile Soft X-ray (VerSoX) beamline at Diamond Light Source

Held, G., Venturini, F., Grinter, D. C. ORCID: https://orcid.org/0000-0001-6089-119X, Ferrer, P., Arrigo, R., Deacon, L., Quevedo Garzon, W., Roy, K., Large, A., Stephens, C., Watts, A., Larkin, P., Hand, M., Wang, H., Pratt, L., Mudd, J. J., Richardson, T. ORCID: https://orcid.org/0000-0002-3886-9006, Patel, S., Hillman, M. and Scott, S. (2020) Ambient-pressure endstation of the Versatile Soft X-ray (VerSoX) beamline at Diamond Light Source. Journal of Synchrotron Radiation, 27 (5). pp. 1153-1166. ISSN 0909-0495 doi: 10.1107/S1600577520009157

Abstract/Summary

The ambient-pressure endstation and branchline of the Versatile Soft X-ray (VerSoX) beamline B07 at Diamond Light Source serves a very diverse user community studying heterogeneous catalysts, pharmaceuticals and biomaterials under realistic conditions, liquids and ices, and novel electronic, photonic and battery materials. The instrument facilitates studies of the near-surface chemical composition, electronic and geometric structure of a variety of samples using X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy in the photon energy range from 170 eV to 2800 eV. The beamline provides a resolving power hν/Δ(hν) > 5000 at a photon flux > 1010 photons s−1 over most of its energy range. By operating the optical elements in a low-pressure oxygen atmosphere, carbon contamination can be almost completely eliminated, which makes the beamline particularly suitable for carbon K-edge NEXAFS. The endstation can be operated at pressures up to 100 mbar, whereby XPS can be routinely performed up to 30 mbar. A selection of typical data demonstrates the capability of the instrument to analyse details of the surface composition of solid samples under ambient-pressure conditions using XPS and NEXAFS. In addition, it offers a convenient way of analysing the gas phase through X-ray absorption spectroscopy. Short XPS spectra can be measured at a time scale of tens of seconds. The shortest data acquisition times for NEXAFS are around 0.5 s per data point.

Item Type	Article
URI	https://reading-clone.eprints-hosting.org/id/eprint/98016
Identification Number/DOI	10.1107/S1600577520009157
Refereed	Yes
Divisions	Life Sciences > School of Chemistry, Food and Pharmacy > Department of Chemistry
Publisher	International Union of Crystallography
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