Structure, stability, and reorganization of 0.5 L0 topography in block copolymer thin films

[thumbnail of Half Features.pdf]
Preview
Text - Accepted Version
· Please see our End User Agreement before downloading.
| Preview

Please see our End User Agreement.

It is advisable to refer to the publisher's version if you intend to cite from this work. See Guidance on citing.

Add to AnyAdd to TwitterAdd to FacebookAdd to LinkedinAdd to PinterestAdd to Email

Maher, M. J., Self, J. L., Stasiak, P., Blachut, G., Ellison, C. J., Matsen, M. W., Bates, C. M. and Willson, C. G. (2016) Structure, stability, and reorganization of 0.5 L0 topography in block copolymer thin films. ACS Nano, 10 (11). pp. 10152-10160. ISSN 1936-086X doi: 10.1021/acsnano.6b05390

Abstract/Summary

The structure, stability, and reorganization of lamella-forming block copolymer thin film surface topography (“islands” and “holes”) were studied under boundary conditions driving the formation of 0.5 L0 thick structures at short thermal annealing times. Self-consistent field theory predicts that the presence of one perfectly neutral surface renders 0.5 L0 topography thermodynamically stable relative to 1 L0 thick features, in agreement with previous experimental observations. The calculated through-film structures match cross-sectional scanning electron micrographs, collectively demonstrating the pinning of edge dislocations at the neutral surface. Remarkably, near-neutral surface compositions exhibit 0.5 L0 topography metastability upon extended thermal treatment, slowly transitioning to 1 L0 islands or holes as evidenced by optical and atomic force microscopy. Surface restructuring is rationalized by invoking commensurability effects imposed by slightly preferential surfaces. The results described herein clarify the impact of interfacial interactions on block copolymer self-assembly and solidify an understanding of 0.5 L0 topography, which is frequently used to determine neutral surface compositions of considerable importance to contemporary technological applications.

Altmetric Badge

Item Type Article
URI https://reading-clone.eprints-hosting.org/id/eprint/67474
Identification Number/DOI 10.1021/acsnano.6b05390
Refereed Yes
Divisions Science > School of Mathematical, Physical and Computational Sciences > Department of Mathematics and Statistics
Publisher American Chemical Society
Download/View statistics View download statistics for this item

Downloads

Downloads per month over past year

University Staff: Request a correction | Centaur Editors: Update this record

Search Google Scholar