Confidence intervals for secondary parameters following a sequential test

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Whitehead, J., Todd, S. ORCID: https://orcid.org/0000-0002-9981-923X and Hall, W. J. (2000) Confidence intervals for secondary parameters following a sequential test. Journal of the Royal Statistical Society: Series B (Statistical Methodology), 62 (4). pp. 731-745. ISSN 1369-7412 doi: 10.1111/1467-9868.00260

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Item Type	Article
URI	https://reading-clone.eprints-hosting.org/id/eprint/63943
Identification Number/DOI	10.1111/1467-9868.00260
Refereed	Yes
Divisions	Science > School of Mathematical, Physical and Computational Sciences > Department of Mathematics and Statistics Science > School of Mathematical, Physical and Computational Sciences > Department of Mathematics and Statistics > Applied Statistics
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