Analysing the locational pattern of international corporate technological research

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Cantwell, J. and Komopolou, E. (2003) Analysing the locational pattern of international corporate technological research. In: Serapio, M. G. and Hayashi, T. (eds.) Internationalization of research and development and the emergence of global R&D networks. Research in International Business (8). Elsevier, London, pp. 41-83. ISBN 9780762310593

Item Type	Book or Report Section
URI	https://reading-clone.eprints-hosting.org/id/eprint/21269
Refereed	Yes
Divisions	Arts, Humanities and Social Science > School of Politics, Economics and International Relations > Economics
Publisher	Elsevier
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