Wen, P. C., Wang, X. J. and Wei, H.
ORCID: https://orcid.org/0000-0002-9664-5748
(2010)
Image restoration for a rectangular poor-pixels detector.
In:
International Symposium on Precision Engineering Measurements and Instrumentation.
SPIE Proceedings, 7544.
SPIE Press, Bellingham, WA, p. 754436.
doi: 10.1117/12.885301
Abstract/Summary
This paper presents a unique two-stage image restoration framework especially for further application of a novel rectangular poor-pixels detector, which, with properties of miniature size, light weight and low power consumption, has great value in the micro vision system. To meet the demand of fast processing, only a few measured images shifted up to subpixel level are needed to join the fusion operation, fewer than those required in traditional approaches. By maximum likelihood estimation with a least squares method, a preliminary restored image is linearly interpolated. After noise removal via Canny operator based level set evolution, the final high-quality restored image is achieved. Experimental results demonstrate effectiveness of the proposed framework. It is a sensible step towards subsequent image understanding and object identification.
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| Additional Information | The symposium was held in Hangzhou, China, 8-11 Aug 2010. |
| Item Type | Book or Report Section |
| URI | https://reading-clone.eprints-hosting.org/id/eprint/17377 |
| Identification Number/DOI | 10.1117/12.885301 |
| Refereed | Yes |
| Divisions | Science > School of Mathematical, Physical and Computational Sciences > Department of Computer Science |
| Additional Information | The symposium was held in Hangzhou, China, 8-11 Aug 2010. |
| Publisher | SPIE Press |
| Download/View statistics | View download statistics for this item |
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