Wakeham, S., Hawkins, G., Henderson, G. and Carthey, N. (2008) Investigation of tin-based alternatives for cadmium in optoelectronic thin-films materials. Applied Optics, 47 (13). C206-C213. ISSN 0003-6935 doi: 10.1364/AO.47.00C206
Abstract/Summary
Increasing legislation has steadily been introduced throughout the world to restrict the use of heavy metals, particularly cadmium (Cd) and lead (Pb) in high temperature pigments, ceramics, and optoelectronic material applications. Removal of cadmium from thin-film optical and semiconductor device applications has been hampered by the absence of viable alternatives that exhibit similar properties with stability and durability. We describe a range of tin-based compounds that have been deposited and characterized in terms of their optical and mechanical properties and compare them with existing cadmium-based films that currently find widespread use in the optoelectronic and semiconductor industries. (c) 2008 Optical Society of America.
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Item Type | Article |
URI | https://reading-clone.eprints-hosting.org/id/eprint/15407 |
Item Type | Article |
Refereed | Yes |
Divisions | Science > School of Mathematical, Physical and Computational Sciences > Department of Computer Science |
Uncontrolled Keywords | CHEMICAL-VAPOR-DEPOSITION, OXIDE-FILMS, OPTICAL-PROPERTIES, INFRARED, FILTERS, PRESSURE, CONSTANTS, COATINGS, SNO2 |
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