Mykhaylyk, T.A., Evans, S.D., Hamley, I.W.
ORCID: https://orcid.org/0000-0002-4549-0926 and Henderson, J.R.
(2005)
Ellipsometric study of adsorption on nanopatterned block copolymer substrates.
Journal of Chemical Physics, 122 (10).
104902.
ISSN 0021-9606
doi: 10.1063/1.1860371
Abstract/Summary
We report ellipsometrically obtained adsorption isotherms for a carefully chosen test liquid on block copolymer films of Kraton G1650, compared with adsorption isotherms on homogeneous films of the constituent polymers. Standard atomic force microscopy images imply the outer surface of Kraton G1650 is chemically patterned on the nanoscale, but this could instead be a reflection of structure buried beneath a 10 nm layer of the lower energy component. Our test liquid was chosen on the basis that it did not dissolve in either component and in addition that it was nonwetting on the lower energy polymer while forming thick adsorbed films on pure substrates of the higher energy component. Our ellipsometry data for Kraton G1650 rule out the presence of segregation by the lower energy constituent to the outer surface, implying a mixed surface consistent with Cassie's law. We discuss implications of our findings and related work for the outer surface structures of block copolymer films.
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| Item Type | Article |
| URI | https://reading-clone.eprints-hosting.org/id/eprint/11519 |
| Identification Number/DOI | 10.1063/1.1860371 |
| Refereed | Yes |
| Divisions | Life Sciences > School of Chemistry, Food and Pharmacy > Department of Chemistry |
| Uncontrolled Keywords | ELECTRON-SPECTROSCOPY, DIBLOCK COPOLYMERS, FREE-SURFACE, FREE-ENERGY, MORPHOLOGY, TRANSITIONS, POLYMERS, FILMS, POLYSTYRENE, STYRENE |
| Download/View statistics | View download statistics for this item |
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