Bonnet-Ben Dhia, A.-S., Chandler-Wilde, S. N.
ORCID: https://orcid.org/0000-0003-0578-1283 and Fliss, S.
(2022)
On the half-space matching method for real wavenumber.
SIAM Journal on Applied Mathematics (SIAP), 82 (4).
pp. 1287-1311.
ISSN 0036-1399
doi: 10.1137/21M1459216
Abstract/Summary
The Half-Space Matching (HSM) method has recently been developed as a new method for the solution of 2D scattering problems with complex backgrounds, providing an alternative to {Perfectly Matched Layers} (PML) or other artificial boundary conditions. Based on half-plane representations for the solution, the scattering problem is rewritten as a system coupling (1) a standard finite element discretisation localised around the scatterer and (2) integral equations whose unknowns are traces of the solution on the boundaries of a finite number of overlapping half-planes contained in the domain. While satisfactory numerical results have been obtained for real wavenumbers, well-posedness and equivalence of this HSM formulation to the original scattering problem have been established only for complex wavenumbers. In the present paper we show, in the case of a homogeneous background, that the HSM formulation is equivalent to the original scattering problem also for real wavenumbers, and so is well-posed, provided the traces satisfy radiation conditions at infinity analogous to the standard Sommerfeld radiation condition. {As a key component of our argument we show that, if the trace on the boundary of a half-plane satisfies our new radiation condition, then the corresponding solution to the half-plane Dirichlet problem satisfies the Sommerfeld radiation condition in a slightly smaller half-plane.} We expect that this last result will be of independent interest, in particular in studies of rough surface scattering.
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| Item Type | Article |
| URI | https://reading-clone.eprints-hosting.org/id/eprint/104100 |
| Identification Number/DOI | 10.1137/21M1459216 |
| Refereed | Yes |
| Divisions | Science > School of Mathematical, Physical and Computational Sciences > Department of Mathematics and Statistics |
| Publisher | Society for Industrial and Applied Mathematics |
| Download/View statistics | View download statistics for this item |
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